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Yanzhi Atomic force microscope Model: CHT-AFM

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1. Surface morphology characterization: the surface roughness, flatness and microstructure of photovoltaic materials (such as silicon wafers, thin film, etc.) can be observed at high resolution, which is crucial for optimizing the performance of cells and improving the photoelectric conversion efficiency.-Detection of defects, scratches, and particles on the battery surface helps to analyze its impact on battery performance.

2. Film thickness measurement: accurately measure the thickness of photovoltaic film (such as amorphous silicon, CdTe, etc.), and is not limited by the transparency of the film and the substrate material.

3. Study on electrical properties of materials: the local conductivity of materials is measured by the conductive atomic force microscope (C-AFM) mode, and the carrier transmission characteristics and the inhomogeneity of electrical properties are studied.

4. Nanometer scale structure analysis: analyze the nanoscale photovoltaic structures, such as quantum dots, nanowires, etc., to understand the impact of their morphology and distribution on the photoelectric performance.

5. Surface chemical analysis: Study the chemical composition and chemical bonding of the surface of photovoltaic materials in combination with specific probes and technologies.

6. Device performance evaluation: study the electrode / semiconductor interface of photovoltaic devices (such as solar cells) to evaluate the quality and contact performance of the interface.

7. Material aging and stability study: monitor the surface changes of photovoltaic materials during use, and evaluate their aging mechanism and stability.

8. Process optimization: to provide feedback and optimization basis for the preparation process of photovoltaic materials (such as deposition, etching, etc.).

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 IEC61215

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