1）The samples can be tested with 49,81,1 center, 10 center, 5 center radius, 5 center edge, 9 center radius edge, diameter scan; statistical analysis test data to generate 2D and 3D map；

2）Shielding test, completely eliminate the impact of light on the sample test, to ensure the accuracy of the measurement；
3）Vacuum adsorption prevents the influence of sample movement on the test during the fully automatic test process；
4）Integrated embedded design, touch the computer screen operation, finger dots can complete the operation.

The four-probe resistance tester is a triumph for engineering and physics but also for engineering and physics. The four-probe is a practical tool and has various applications in various industries. Four probes is suitable for semiconductor and solar cells (monocrystalline silicon, polysilicon, amorphous silicon, perovskite), liquid crystal panel (ITO / AZO), functional materials (thermoelectric materials, carbon nanotubes, graphene, nanowires, conductive fibers, composite materials), semiconductor process detection (metallization / ion injection / diffusion layer), amorphous alloy, shape memory alloy, semiconductor manufacturing and other industries.

Four-probe meter is a commonly used measurement tool for measuring the resistivity of electronic materials (such as silicon (Si), germanium (Ge), gallium arsenide (GaAs) and other semiconductor materials and the resistivity value of thin films (thin layer) for electronic devices.

The CHT-4500 RH is a scanning four-probe resistance tester designed for scientific research to perform rapid, automatic scans of a maximum 200mm sample (or 8-inch wafer) to obtain information on the square resistance / resistivity distribution at different positions of the sample. The probe head borrows from the mechanical clock movement manufacturing process, and uses the ruby bearing to guide the tungsten carbide probe to ensure high mechanical precision and long service life. Dynamic test repetition (close to the real scene) can reach 0.2%, which is the industry-leading level. The ultra-wide measurement range of 1 μΩ ~ 1 MΩ can cover most application scenarios, and can be widely used in photovoltaic, semiconductor, alloy, ceramics and many other fields. 

CHT-4500 RH type automatic four-probe testing system is a multi-purpose comprehensive automatic measuring equipment using the four-probe measurement principle. The equipment follows the national standard of monocrystalline silicon physical test method and refers to the American A.S.T. M standard, special equipment designed for testing the resistivity of semiconductor materials and block resistance (thin layer resistance). Through the automatic test system, the resistivity and block resistance distribution of the wafer are measured. After the contour graph is drawn, the distribution of the whole wafer is directly observed.

The CHT-4500 RH automatic test system applies the van der Burger measurement method to the linear four-probe by adopting the four-probe combination measurement technique. Using the combination transformation of current probe and voltage probe to make two electrical measurements, and the final calculation results can automatically eliminate the adverse effects on the measurement results caused by sample geometry size, boundary effect, probe inequality and mechanical drift. Therefore, during the test process, the probe spacing, the sample size and the position of the probe on the sample surface can not be considered under the basic conditions. This dynamic automatic correction of the above adverse factors significantly reduces its impact on the test results, thus improving the accuracy of the measurement results.

CHT-4500 RH automatic four probe software test system has a friendly operation test interface, through this test program to assist users to easily conduct the test operation, the collected test data for mathematical analysis, and then the test data in Excel table, 2D, 3D and other numerical charts intuitive record, display. It is convenient for users to conduct various data analysis on the data. Users can save or print the collected data in the computer for future reference and view.

Automatic four-probe software test system