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Location:Home > Photovoltaic Test Products > Batteries > 3D microscope
CHT-X6 series 3D optical interferometer is based on phase shift interferometer (PSI), white light vertical scanning interferometer (VSI) and (CSI) monochromatic light vertical scanning interferometer, with its nano measurement accuracy and repeatability (stability), quantitatively reflects the surface roughness, surface contour, step height, size and morphology characteristics of key parts. Widely used in integrated circuit manufacturing, MEMS, aerospace, precision machining, surface engineering technology, materials, solar cell technology and other fields.
Product characteristics1) Roughness measurement characterizing the micromorphology; 2) Step height, Angle and other contour dimension measurement; 3) Automatic focus, automatic looking for stripes, automatic brightness adjustment and other automatic auxiliary functions; 4) Data processing functions such as leveling, image repair drawing, denoising, filtering, area extraction and so on; 5) Comparative analysis and multi-file analysis and other auxiliary analysis functions. |
Measurement1) Non-contact measurement: to obtain the surface morphology information without damage; 2) High precision: roughness / contour information measurement accuracy of 1nm; 3) Fast measurement: fast focus, fast scanning, fast reconstruction processing; 4) Stability: good anti-vibration and anti-interference ability, to adapt to the complex working environment. |
Analysis1) Visualization of data: Provide intuitive data visualization display for direct observation of interference patterns and measurement results; 2) It also supports data export to common file formats to facilitate further data analysis; 3) Powerful data analysis function: through the image processing algorithm and advanced analysis software, users can conduct phase extraction, surface topology analysis; 4) Multiple analysis such as film thickness calculation, thus achieving more detailed test results and more comprehensive characterization. |
Product superiority1) Non-contact, fast and flexible, powerful opto-mechatronics integration detection system; 2) The equipment has the function of measuring contour size and roughness to characterizing the microscopic morphology; 3) The equipment has the automatic splicing function, which can quickly realize the splicing and suture measurement of a large area; 4) The equipment has integrated operation measurement and analysis software, set the configuration parameters in advance for measurement, the software automatically statistics the measurement data and provides the data report export function, can quickly realize the batch measurement function; 5) The equipment has the data processing function of four modules: position adjustment, correction, filtering and extraction; 6) The equipment has roughness analysis, geometric contour analysis, structural analysis, frequency analysis, functional analysis and other five analysis functions; 7) The device has auxiliary analysis functions such as one-click analysis and multi-file analysis, which can realize the rapid analysis function of batch data files. |
Industry applications1)Application of suede pyramid measurement The 3D-dimensional, 2D structure of the I surface; Height and width measurements of individual pyramids; Pyramid counting function: it can automatically count the number of grains per unit area, And mark the grain position with a cross symbol on the view, Quantity layout diagram of the pyramids of different specifications. 2)Grid line measurement I grid line height and width measurement function: Number of profile lines in a single field of view; Grid line area automatic division function; Grid line automatic measurement function. 3)integrated circuit wafer back thinning roughness 4)perovskite thin film solar energy technology laser tank measurement step height measurement |
Model | CHT-X6 | CHT-X62 | CHT-X63 | |
Travel range | X | 100mm | 230mm | 300mm |
Y | 100mm | 230mm | 300mm | |
Z | 100mm | 100mm | 100mm | |
Outline dimension | 520×380×600mm | 720×580×1500mm | 1000×900×1500mm | |
Instruments weight | 50kg | 400kg | 500kg | |
Measuring principle | Confocal optical system | |||
Microobjective | Standard equipment: 10X Optional: 2.5X 5,20,50,100 | |||
Field range | 120×120 μm~1.2×1.2 mm | |||
Measurement of elevation | Repeatability * 1 (1 σ) | ≤0.1% 1σ | ||
display resolution | 0.1nm | |||
Width measurement | Repeatability * 2 (1 σ) | ≤0.5% | ||
accuracy *2 | ±1.5% | |||
display resolution | 0.1nm | |||
XY displacement platform | load | 10kg | ||
control method | Manual and automatic | |||
Z0 axis scan range | 100m | |||
The object mirror tower | 5 Hole electric | |||
illuminant | white light LED | |||
Work environment | source | 100-240V AC, 50 / 60Hz, 2A power, 300W | ||
working temperature | 15℃ – 30℃ with a temperature gradient <2℃ / 60 min | |||
relative humidity | 5% ~ 95% RH, with no condensation | |||
ambient vibration | VC-C or better | |||
other | No strong magnetic field, no corrosive gas |