PV Module Damp Heat, Freeze-Thaw Test Chamber Model: CHT-19-12-3
Hot and heat test box Model: CHT-19-12-2
Thermal cycle environment test box Model: CHT-19-12-3
Optical aging stability test box Model: CHT-1800
Steady-state simulation test box Model: CHT-WTBBA
UV accelerated aging test box Model: CHT-UVDC28
Current Continuity Test System Model: CHT-11D
Diode Thermal Performance Test System Model: CHT-12D
Pulse voltage test system Model: CHT-14D
PV Module Salt Spray Corrosion Test Chamber:CHT-16D
Optical senescence test box / photovoltaic module test LID: CHT-18D
Insulation withstand voltage tester Model: CHT-2813W
Wet leakage test system Model: CHT-3621W
Outdoor sun exposure test system model: CHT-H206
Dynamic Load Test Machine Model: CHT-20D
Static load test machine model: CHT-26D
PID Test System Model: CHT-PID
Component crushing tester Model: CHT-30D
Grounding continuity Tester Model: CHT-2813W
Lead end strength test machine Model: CHT-31
Appearance table Model: CHT-W26
Drop ball impact test machine Model: CHT-10
Photovoltaic welding strip stripping force testing machine
photovoltaic welding strip stripping force integrated machine
Universal material testing machine
Photovoltaic glass four-point bending test machine model: CHT-4 WQJN
Crosslinking degree test System Model: EVA-CC
2nd element image instrument model: CHT-3020
Two-dimensional image instrument
Acetic acid test box Model: CHT-YW 400
High pressure Accelerated aging test box Model: CHT-HAST-800
Differential Scanning Calorimeter (DSC) Model: CHT-CS300
Spectrophotometer Model: CHT-3400
Fourier transform infrared spectrometer model: CHT-H8030
Photovoltaic welding strip stripping force testing machine
Photovoltaic welding strip stripping force integrated machine
Universal material testing machine
Full-spectrum Ellipsometer Model: CHT-TP 01
Water vapor transmission and filtration rate Model: CHT-40B
No-rotor vulcanizer model: CHT-LH 06
Atomic force microscope Model: CHT-AFM
Solar cell TLM grid line contact resistance analyzer model: CHT-6070 TLM
Battery cell light aging box Model: CHT-DCPBBA
Photovoltaic cell PL detector model: CHT-80D
Scan four-probe square resistance meter Model: CHT-4500 RH
1) Test function
This device contains 2 test functions, which can place 18 samples at one time for automatic testing.
2) Test the contact resistance
For testing contact resistance, thin layer resistance, contact resistivity and other items,
3) Test the line resistance
To test the line resistance of the grid line, you can test the 5-10mm wide cut cells.
If the customer needs to test the line resistance of more than 10mm wide, need customized special platform.
Test Schematic Drawing (TLM)Contact resistance is an important aspect to be considered in solar cell electrode optimization. The size of the contact resistance is not only related to the pattern of the contact, but also related to the diffusion process and the sintering process. Measuring contact resistivity can reflect the problems in diffusion, electrode fabrication and sintering. The testing equipment has two test functions: contact resistivity test and line resistance test, which can be used differently. The test principle is as follows: The measured resistance consists of three parts: 1) The metal contact resistance of the probe and the electrode on both sides is Rm (considering <<Rc, negligible); 2) The contact resistance between the electrode and the studied material, Rc; 3) Square resistance Rsh of semiconductor materials. By changing the electrode spacing d, the relationship curve between RTLM and d can be obtained, thus extracting the interface contact resistance Rc and the square resistance Rsh of the studied material. |
Introduction to the probe tipgraph 4 Figure 4 shows the contact resistance probe, the spacing between two adjacent probe axes can be selected in the range of 0.5mm and 3mm, and different spacing specifications can be customized according to user requirements. graph 5 Figure 5 shows the line resistance probe, adjacent probe sets, outer axis spacing of 10mm, The measurable grid line length is 10-50mm, and different spacing specifications can be customized according to user requirements. |
Test distribution mapThin Distribution-sheet resistance (Q / sq) graph 7 The upper above is the resistance distribution of the seven samples tested. Each film each tested 5 areas, with the depth of red to indicate the size of the thin layer of resistance, intuitively showing the size of the resistance. Distribution map of the contact resistance-contact resistance(Q) graph 8 The figure above is the contact resistance distribution diagram of the seven test films. Each film was tested in 5 areas, with the depth of red to indicate the size of the thin layer of resistance, intuitively showing the size of the resistance. Contact resistivity profile-pc (m Ω * cm2) graph 9 The figure above is the resistivity distribution of the seven test films. Each film was tested in 5 areas, with the depth of red to indicate the size of the thin layer of resistance, intuitively showing the size of the resistance. Line Resistance Test Interface Drawing-line resistance (Q / cm) graph 10 The figure above is the interface diagram during testing the line resistance. The display on the right side of the interface shows the fraction of the line resistance of each line in a film. |
Technical index of the TLM contact resistance | |
---|---|
Suitable battery size | Cut cell of size 230mm and below |
Measured sample width | 5~10mm |
Probe | There are the following options available: Fixed probe head: processing according to customer size, processing range 0.5-3mm; adjustable probe head: 4 specifications, (1)0.9-1.0mm(2)1.0-1.2mm(2)1.2-1.8mm(3)1.8-2.5mm |
Contact resistance measurement range | 0~120Ω |
Contact resistance measures repeatability | Better than 5% or 0.5 mQ * cm ^ 2 |
Technical index of line resistance (optional) | |
Suitable battery size | Cut cell of size 230mm and below |
Measurable sample width | 5-10mm, and other specifications need to be specially customized |
Line resistance measurement range | 0~40 Q/cm |
Line resistance measures repeatability | Better than 5% or 0.20 / cm |
Technical index of diffusion square resistance (optional) | |
Suitable battery size | Cell cells in size of 230mm and below |
Measuring range | 5×10-4~2×10⁵Q/□ |
Square resistance test for repeatability | Better than 3% |